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EEPROM bit failure investigation

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dc.contributor.author Chen, Y. en_US
dc.contributor.author Kemski, R. en_US
dc.contributor.author Scheick, L. en_US
dc.contributor.author Stott, F. en_US
dc.contributor.author Nguyen, D. en_US
dc.contributor.author Nguyen, T. en_US
dc.contributor.author Bennett, R. en_US
dc.contributor.author Erickson, K. en_US
dc.date.accessioned 2004-09-16T23:52:38Z
dc.date.available 2004-09-16T23:52:38Z
dc.date.issued 2003-09-09 en_US
dc.identifier.citation 6th Military and Aerospace Programmable Logic Devices International Conference en_US
dc.identifier.citation Washington D.C., USA en_US
dc.identifier.clearanceno 03-2365 en_US
dc.identifier.uri http://hdl.handle.net/2014/7873
dc.description.abstract This paper reports the investigation findings concerning of the EEPROM single bit failures that were observed on a recent NASA space mission. en_US
dc.format.extent 3371290 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other EEPROM en_US
dc.title EEPROM bit failure investigation en_US


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