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Proton nonionizing energy loss (NIEL) for device applications

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dc.contributor.author Jun, I. en_US
dc.contributor.author Xapsos, M. A. en_US
dc.contributor.author Messenger, S. R. en_US
dc.contributor.author Burke, E. A. en_US
dc.contributor.author Walters, R. J. en_US
dc.contributor.author Summers, G. P. en_US
dc.contributor.author Jordan, T. en_US
dc.date.accessioned 2004-09-16T23:21:37Z
dc.date.available 2004-09-16T23:21:37Z
dc.date.issued 2003-07-21 en_US
dc.identifier.citation IEEE Nuclear and Space Radiation Effects Conference en_US
dc.identifier.citation Monterey, California, USA en_US
dc.identifier.clearanceno 03-1817 en_US
dc.identifier.uri http://hdl.handle.net/2014/7678
dc.description.abstract The proton induced NIEL for representative device materials are presented for the energy range between 1 keV to 1000 MeV. en_US
dc.format.extent 3098758 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other NIEL protons Coulomb nuclear en_US
dc.title Proton nonionizing energy loss (NIEL) for device applications en_US


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