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The Dual-Rasp Sampling System for an Enceladus Lander

The Dual-Rasp Sampling System for an Enceladus Lander

Backes, Paul G; Moreland, Scott; Badescu, Mircea; Riccobono, Dario; Brinkman, Alex; Choukroun, Mathieu; Molaro, Jamie; Aggerwal, Rajan; Newbold, Timothy; Ahmad, Adeel; Ubellacker, Samuel
URI: http://hdl.handle.net/2014/52738
Date: 2020-03-07
Publisher: Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2020
Citation: 2020 IEEE Aerospace Conference, Big Sky, Montana, March 7-14, 2020

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