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Non-Destructive Examination Case Studies for Space Exploration Applications

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dc.contributor.author Bescup, John
dc.date.accessioned 2021-11-18T22:01:13Z
dc.date.available 2021-11-18T22:01:13Z
dc.date.issued 2020-02-04
dc.identifier.citation Microelectronics Reliability and Qualification Workshop (MRQW) 2020, El Segundo, California, February 4-6, 2020
dc.identifier.clearanceno CL#20-0717
dc.identifier.uri http://hdl.handle.net/2014/52526
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2020
dc.title Non-Destructive Examination Case Studies for Space Exploration Applications
dc.type Presentation


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