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Physics-driven dual-defect model fits of voltage step-up to breakdown data in spacecraft polymers

Physics-driven dual-defect model fits of voltage step-up to breakdown data in spacecraft polymers

Anderson, Allen; Dennison, JR
URI: http://hdl.handle.net/2014/51666
Date: 2019-10-20
Publisher: Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2019
Citation: Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Richland, Washington, October 20-23, 2019

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