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Physics-driven dual-defect model fits of voltage step-up to breakdown data in spacecraft polymers
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Physics-driven dual-defect model fits of voltage step-up to breakdown data in spacecraft polymers
Anderson, Allen
;
Dennison, JR
URI:
http://hdl.handle.net/2014/51666
Date:
2019-10-20
Publisher:
Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2019
Citation:
Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Richland, Washington, October 20-23, 2019
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JPL TRS 1992+
JPL TRS 1992+
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