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Destructive Single-Events and Latchup in Radiation-Hardened Switching Regulators

Destructive Single-Events and Latchup in Radiation-Hardened Switching Regulators

Vartanian, Sergeh; Allen, Gregory R.; Irom, Farokh; Scheick, Leif Z.; Hart, Shirley; van Vonno, Nick W.; Pearce, Larry
URI: http://hdl.handle.net/2014/47724
Date: 2017-10-01
Publisher: Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2017
Citation: RADECS 2017 - RADiation Effects on Components & Systems, Geneva, Switzerland, October 1-6, 2017

Abstract:

Single-event destructive behavior and latchup has been observed in two separate radiation-hardened switching regulators. We discuss the test conditions and observed results.

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