Range-Gated Metrology: an ultra-compact sensor for dimensional stabilization

Lay, Oliver P.; Dubovitsky, Serge; Shaddock, Daniel A.; Ware, Brent; Woodruff, Christopher S.

dc.contributor.author	Lay, Oliver P.
dc.contributor.author	Dubovitsky, Serge
dc.contributor.author	Shaddock, Daniel A.
dc.contributor.author	Ware, Brent
dc.contributor.author	Woodruff, Christopher S.
dc.date.accessioned	2014-12-10T00:41:16Z
dc.date.available	2014-12-10T00:41:16Z
dc.date.issued	2008-06-23
dc.identifier.citation	SPIE Conference on Astronomical Instrumentation, Marseille, France, June 23 - 28, 2008	en_US
dc.identifier.clearanceno	08-1710
dc.identifier.uri	http://hdl.handle.net/2014/44826
dc.description.abstract	Point-to-point laser metrology systems can be used to stabilize large structures at the nanometer levels required for precision optical systems. In this paper we describe the concept behind Range-Gated Metrology, demonstrate the performance in a laboratory environment, and give examples of how such a sensor system might be deployed.	en_US
dc.description.sponsorship	NASA/JPL	en_US
dc.language.iso	en_US	en_US
dc.publisher	Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008	en_US
dc.subject	laser metrology	en_US
dc.title	Range-Gated Metrology: an ultra-compact sensor for dimensional stabilization	en_US
dc.type	Preprint	en_US