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Range-Gated Metrology: an ultra-compact sensor for dimensional stabilization

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dc.contributor.author Lay, Oliver P.
dc.contributor.author Dubovitsky, Serge
dc.contributor.author Shaddock, Daniel A.
dc.contributor.author Ware, Brent
dc.contributor.author Woodruff, Christopher S.
dc.date.accessioned 2014-12-10T00:41:16Z
dc.date.available 2014-12-10T00:41:16Z
dc.date.issued 2008-06-23
dc.identifier.citation SPIE Conference on Astronomical Instrumentation, Marseille, France, June 23 - 28, 2008 en_US
dc.identifier.clearanceno 08-1710
dc.identifier.uri http://hdl.handle.net/2014/44826
dc.description.abstract Point-to-point laser metrology systems can be used to stabilize large structures at the nanometer levels required for precision optical systems. In this paper we describe the concept behind Range-Gated Metrology, demonstrate the performance in a laboratory environment, and give examples of how such a sensor system might be deployed. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008 en_US
dc.subject laser metrology en_US
dc.title Range-Gated Metrology: an ultra-compact sensor for dimensional stabilization en_US
dc.type Preprint en_US


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