Keywords:analog switches; ADC; oscillators; SDRAM; FPGA; drivers; microprocessors; voltage comparator; voltage regulator
Publisher:Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2010
Citation:2010 IEEE Nuclear and Space Radiation Effects Workshop, Denver, Colorado, July 19–23, 2010
Abstract:
This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests for a variety of microelectronic devices. The compendium covers devices tested over the last two years by the Jet Propulsion Laboratory.