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Compendium of test results of recent single event effect tests conducted by the Jet Propulsion Laboratory

Compendium of test results of recent single event effect tests conducted by the Jet Propulsion Laboratory

McClure, Steven S.; Allen, Gregory R.; Irom, Farokh; Scheick, Leif Z.; Adell, Philippe C.; Miyahira, Tetsuo F.
URI: http://hdl.handle.net/2014/44752
Date: 2010-07-19
Keywords: analog switches; ADC; oscillators; SDRAM; FPGA; drivers; microprocessors; voltage comparator; voltage regulator
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2010
Citation: 2010 IEEE Nuclear and Space Radiation Effects Workshop, Denver, Colorado, July 19–23, 2010

Abstract:

This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests for a variety of microelectronic devices. The compendium covers devices tested over the last two years by the Jet Propulsion Laboratory.

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