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Challenges of developing qualification methods for DDR class devices – Part 2

Challenges of developing qualification methods for DDR class devices – Part 2

Guertin, Steven M.
URI: http://hdl.handle.net/2014/43906
Date: 2011-06-29
Keywords: reliability testing; cell retention; Double Data Rate 2 (DDR2); DDR3
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.
Citation: NEPP Electronic Technology Workshop, Greenbelt, Maryland, June 28-30, 2011

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