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Single-event transient testing of low dropout PNP series linear voltage regulators

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dc.contributor.author Adell, Philippe
dc.contributor.author Allen, Gregory
dc.date.accessioned 2013-05-10T17:55:41Z
dc.date.available 2013-05-10T17:55:41Z
dc.date.issued 2013-01
dc.identifier.uri http://hdl.handle.net/2014/43136
dc.description.abstract As demand for high-speed, on-board, digital-processing integrated circuits on spacecraft increases (field-programmable gate arrays and digital signal processors in particular), the need for the next generation point-of-load (POL) regulator becomes a prominent design issue. Shrinking process nodes have resulted in core rails dropping to values close to 1.0 V, drastically reducing margin to standard switching converters or regulators that power digital ICs. The goal of this task is to perform SET characterization of several commercial POL converters, and provide a discussion of the impact of these results to state-of-the-art digital processing IC through laser and heavy ion testing en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2013. en_US
dc.relation.ispartofseries JPL Publication en_US
dc.relation.ispartofseries 13-7 en_US
dc.subject Integrated Circuit (IC), en_US
dc.subject Field-Programmable Gate Array (FPGA) en_US
dc.subject Digital Signal Processor (DSP) en_US
dc.subject Point-of-Load regulator (POL) en_US
dc.subject Switching converter en_US
dc.subject hybrid converter en_US
dc.title Single-event transient testing of low dropout PNP series linear voltage regulators en_US
dc.type Technical Report en_US
dc.subject.NASATaxonomy Electronics and Electrical Engineering en_US


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