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Reliability considerations for ultra- low power space applications

Reliability considerations for ultra- low power space applications

White, Mark; Johnston, Allan
URI: http://hdl.handle.net/2014/42707
Date: 2012-04-15
Keywords: ultra-low power (ULP); microelectronics; reliability
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012.
Citation: 2012 IEEE International Reliability Physics Symposium (IRPS), Anaheim, California, April 15-19 , 2012

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