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Reliability considerations for ultra- low power space applications
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Reliability considerations for ultra- low power space applications
White, Mark
;
Johnston, Allan
URI:
http://hdl.handle.net/2014/42707
Date:
2012-04-15
Keywords:
ultra-low power (ULP); microelectronics; reliability
Publisher:
Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012.
Citation:
2012 IEEE International Reliability Physics Symposium (IRPS), Anaheim, California, April 15-19 , 2012
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JPL TRS 1992+
JPL TRS 1992+
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