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NAND flash qualification guideline

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dc.contributor.author Heidecker, Jason
dc.date.accessioned 2013-02-01T00:07:52Z
dc.date.available 2013-02-01T00:07:52Z
dc.date.issued 2012-06-11
dc.identifier.citation 3rd NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology Workshop, Greenbelt, Maryland, June 11-13, 2012. en_US
dc.identifier.clearanceno 12-2349
dc.identifier.uri http://hdl.handle.net/2014/42687
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012. en_US
dc.subject Floating Gate Memory en_US
dc.subject Reliability Issues en_US
dc.subject Failure Modes en_US
dc.title NAND flash qualification guideline en_US
dc.type Presentation en_US
dc.subject.NASATaxonomy Electronics and Electrical Engineering en_US


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