dc.contributor.author |
Heidecker, Jason |
|
dc.date.accessioned |
2013-02-01T00:07:52Z |
|
dc.date.available |
2013-02-01T00:07:52Z |
|
dc.date.issued |
2012-06-11 |
|
dc.identifier.citation |
3rd NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology Workshop, Greenbelt, Maryland, June 11-13, 2012. |
en_US |
dc.identifier.clearanceno |
12-2349 |
|
dc.identifier.uri |
http://hdl.handle.net/2014/42687 |
|
dc.description.sponsorship |
NASA/JPL |
en_US |
dc.language.iso |
en_US |
en_US |
dc.publisher |
Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012. |
en_US |
dc.subject |
Floating Gate Memory |
en_US |
dc.subject |
Reliability Issues |
en_US |
dc.subject |
Failure Modes |
en_US |
dc.title |
NAND flash qualification guideline |
en_US |
dc.type |
Presentation |
en_US |
dc.subject.NASATaxonomy |
Electronics and Electrical Engineering |
en_US |