Status on radiation qualification methods for SOC devices

Guertin, Steven M.

dc.contributor.author	Guertin, Steven M.
dc.date.accessioned	2012-07-12T21:22:10Z
dc.date.available	2012-07-12T21:22:10Z
dc.date.issued	2011-06-29
dc.identifier.citation	Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011, Greenbelt, Maryland, June 28-29, 2011	en_US
dc.identifier.clearanceno	11-2471
dc.identifier.uri	http://hdl.handle.net/2014/42172
dc.description.sponsorship	NASA/JPL	en_US
dc.language.iso	en_US	en_US
dc.publisher	Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.	en_US
dc.subject	Electronics and Electrical Engineering (SEE) Test Methods	en_US
dc.subject	Test Methods	en_US
dc.subject	Radiation Hardening by Design (RHBD)	en_US
dc.subject	System-On-Chip (SoC) devices	en_US
dc.title	Status on radiation qualification methods for SOC devices	en_US
dc.type	Presentation	en_US
dc.subject.NASATaxonomy	Electronics and Electrical Engineering	en_US