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Status on radiation qualification methods for SOC devices

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dc.contributor.author Guertin, Steven M.
dc.date.accessioned 2012-07-12T21:22:10Z
dc.date.available 2012-07-12T21:22:10Z
dc.date.issued 2011-06-29
dc.identifier.citation Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011, Greenbelt, Maryland, June 28-29, 2011 en_US
dc.identifier.clearanceno 11-2471
dc.identifier.uri http://hdl.handle.net/2014/42172
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011. en_US
dc.subject Electronics and Electrical Engineering (SEE) Test Methods en_US
dc.subject Test Methods en_US
dc.subject Radiation Hardening by Design (RHBD) en_US
dc.subject System-On-Chip (SoC) devices en_US
dc.title Status on radiation qualification methods for SOC devices en_US
dc.type Presentation en_US
dc.subject.NASATaxonomy Electronics and Electrical Engineering en_US


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