dc.contributor.author |
Guertin, Steven M. |
|
dc.date.accessioned |
2012-07-12T21:22:10Z |
|
dc.date.available |
2012-07-12T21:22:10Z |
|
dc.date.issued |
2011-06-29 |
|
dc.identifier.citation |
Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011, Greenbelt, Maryland, June 28-29, 2011 |
en_US |
dc.identifier.clearanceno |
11-2471 |
|
dc.identifier.uri |
http://hdl.handle.net/2014/42172 |
|
dc.description.sponsorship |
NASA/JPL |
en_US |
dc.language.iso |
en_US |
en_US |
dc.publisher |
Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011. |
en_US |
dc.subject |
Electronics and Electrical Engineering (SEE) Test Methods |
en_US |
dc.subject |
Test Methods |
en_US |
dc.subject |
Radiation Hardening by Design (RHBD) |
en_US |
dc.subject |
System-On-Chip (SoC) devices |
en_US |
dc.title |
Status on radiation qualification methods for SOC devices |
en_US |
dc.type |
Presentation |
en_US |
dc.subject.NASATaxonomy |
Electronics and Electrical Engineering |
en_US |