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NAND flash screening and qualification guideline for space application

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dc.contributor.author Heidecker, Jason
dc.date.accessioned 2012-03-01T23:15:45Z
dc.date.available 2012-03-01T23:15:45Z
dc.date.issued 2012-02
dc.identifier.uri http://hdl.handle.net/2014/41965
dc.description.abstract All space missions have a need for nonvolatile memory (NVM), which maintains data integrity when unpowered. Types of NVM include PROM, EEPROM, NOR Flash, and NAND Flash. PROMs, NOR Flash, and EEPROMs are good choices for storing smaller file size data such as boot code or FPGA configurations. These products have excellent data retention characteristics and can reliably store data for years, unpowered, without any data corruption. They can also be read many times without disturbing the data. Another application of NVM is storage of science and engineering data, which requires large of amounts of memory. The highest density memories available today are SDRAM and NAND Flash. However, the power required to operate and store data in NAND Flash is far less than SDRAM. Wherever high density and low power is required, NAND Flash is very attractive. en_US
dc.description.sponsorship NASA/JPL en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2012. en_US
dc.relation.ispartofseries JPL Publication en_US
dc.relation.ispartofseries 12-1 en_US
dc.subject screening en_US
dc.subject qualifications en_US
dc.subject NAND Flash en_US
dc.title NAND flash screening and qualification guideline for space application en_US
dc.type Technical Report en_US
dc.subject.NASATaxonomy Spacecraft Instrumentation and Astrionics en_US


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