JPL Technical Report Server

Single-Event Effect (SEE) survey of advanced reconfigurable field programmable gate arrays : NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

Show simple item record

dc.contributor.author Allen, Gregory
dc.date.accessioned 2012-01-31T22:45:12Z
dc.date.available 2012-01-31T22:45:12Z
dc.date.issued 2011-12
dc.identifier.uri http://hdl.handle.net/2014/41947
dc.description.abstract The NEPP Reconfigurable Field-Programmable Gate Array (FPGA) task has been charged to evaluate reconfigurable FPGA technologies for use in space. Under this task, the Xilinx single-event-immune, reconfigurable FPGA (SIRF) XQR5VFX130 device was evaluated for SEE. Additionally, the Altera Stratix-IV and SiliconBlue iCE65 were screened for single-event latchup (SEL). en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011. en_US
dc.relation.ispartofseries JPL Publication en_US
dc.relation.ispartofseries 11-18 en_US
dc.subject Reconfigurable Field-Programmable Gate Array (FPGA) en_US
dc.subject Xilinx Single-Event Effects (SEE) Test Consortium en_US
dc.subject single-event upset (SEU) en_US
dc.subject single-event functional interrupt (SEFI) en_US
dc.title Single-Event Effect (SEE) survey of advanced reconfigurable field programmable gate arrays : NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance en_US
dc.type Technical Report en_US
dc.subject.NASATaxonomy Electronics and Electrical Engineering en_US


Files in this item

This item appears in the following Collection(s)

Show simple item record

Search


Browse

My Account