Single-Event Effect (SEE) survey of advanced reconfigurable field programmable gate arrays : NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance

Allen, Gregory

dc.contributor.author	Allen, Gregory
dc.date.accessioned	2012-01-31T22:45:12Z
dc.date.available	2012-01-31T22:45:12Z
dc.date.issued	2011-12
dc.identifier.uri	http://hdl.handle.net/2014/41947
dc.description.abstract	The NEPP Reconfigurable Field-Programmable Gate Array (FPGA) task has been charged to evaluate reconfigurable FPGA technologies for use in space. Under this task, the Xilinx single-event-immune, reconfigurable FPGA (SIRF) XQR5VFX130 device was evaluated for SEE. Additionally, the Altera Stratix-IV and SiliconBlue iCE65 were screened for single-event latchup (SEL).	en_US
dc.description.sponsorship	NASA/JPL	en_US
dc.language.iso	en_US	en_US
dc.publisher	Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2011.	en_US
dc.relation.ispartofseries	JPL Publication	en_US
dc.relation.ispartofseries	11-18	en_US
dc.subject	Reconfigurable Field-Programmable Gate Array (FPGA)	en_US
dc.subject	Xilinx Single-Event Effects (SEE) Test Consortium	en_US
dc.subject	single-event upset (SEU)	en_US
dc.subject	single-event functional interrupt (SEFI)	en_US
dc.title	Single-Event Effect (SEE) survey of advanced reconfigurable field programmable gate arrays : NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance	en_US
dc.type	Technical Report	en_US
dc.subject.NASATaxonomy	Electronics and Electrical Engineering	en_US