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Post-test analysis of the Deep Space One Spare Flight Thruster Ion Optics

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dc.contributor.author Anderson, John R.
dc.contributor.author Sengupta, Anita
dc.contributor.author Brophy, John R.
dc.date.accessioned 2011-06-29T22:17:24Z
dc.date.available 2011-06-29T22:17:24Z
dc.date.issued 2004-07-11
dc.identifier.citation 40th AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit, Fort Lauderdale, Florida, July 11-14, 2004. en_US
dc.identifier.clearanceno 04-2120
dc.identifier.uri http://hdl.handle.net/2014/41768
dc.description.abstract The Deep Space 1 (DSl) spare flight thruster (FT2) was operated for 30,352 hours during the extended life test (ELT). The test was performed to validate the service life of the thruster, study known and identify unknown life limiting modes. Several of the known life limiting modes involve the ion optics system. These include loss of structural integrity for either the screen grid or accelerator grid due to sputter erosion from energetic ions striking the grid, sputter erosion enlargement of the accelerator grid apertures to the point where the accelerator grid power supply can no longer prevent electron backstreaming, unclearable shorting between the grids causes by flakes of sputtered material, and rouge hole formation due to flakes of material defocusing the ion beam. Grid gap decrease, which increases the probability of electron backstreaming and of arcing between the grids, was identified as an additional life limiting mechanism after the test. A combination of accelerator grid aperture enlargement and grid gap decrease resulted in the inability to prevent electron backstreaming at full power at 26,000 hours of the ELT. Through pits had eroded through the accelerator grid webbing and grooves had enetrated through 45% of the grid thickness in the center of the grid. The upstream surface of the screen grid eroded in a chamfered pattern around the holes in the central portion of the grid. Sputter deposited material, from the accelerator grid, adhered to the downstream surface of the screen grid and did not spall to form flakes. Although a small amount of sputter deposited material protruded into the screen grid apertures, no rouge holes were found after the ELT. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004 en_US
dc.subject NASA Solar electric propulsion Technology Application Readiness (NSTAR) en_US
dc.subject ion optics en_US
dc.title Post-test analysis of the Deep Space One Spare Flight Thruster Ion Optics en_US
dc.type Preprint en_US


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