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Multilayer piezoelectric stack actuator characterization

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dc.contributor.author Sherrit, Stewart
dc.contributor.author Jones, Christopher M.
dc.contributor.author Aldrich, Jack B.
dc.contributor.author Blodget, Chad
dc.contributor.author Bao, Xioaqi
dc.contributor.author Badescu, Mircea
dc.contributor.author Bar-Cohen, Yoseph
dc.date.accessioned 2010-08-30T16:31:02Z
dc.date.available 2010-08-30T16:31:02Z
dc.date.issued 2008-02-11
dc.identifier.citation SPIE Smart Structures and Materials & Nondestructive Eavaluation and Health Monitoring, San Diego, CA 2008 en_US
dc.identifier.clearanceno 08-299
dc.identifier.uri http://hdl.handle.net/2014/41642
dc.description.abstract Future NASA missions are increasingly seeking to use actuators for precision positioning to accuracies of the order of fractions of a nanometer. For this purpose, multilayer piezoelectric stacks are being considered as actuators for driving these precision mechanisms. In this study, sets of commercial PZT stacks were tested in various AC and DC conditions at both nominal and extreme temperatures and voltages. AC signal testing included impedance, capacitance and dielectric loss factor of each actuator as a function of the small-signal driving sinusoidal frequency, and the ambient temperature. DC signal testing includes leakage current and displacement as a function of the applied DC voltage. The applied DC voltage was increased to over eight times the manufacturers’ specifications to investigate the correlation between leakage current and breakdown voltage. Resonance characterization as a function of temperature was done over a temperature range of –180C to +200C which generally exceeded the manufacturers’ specifications. In order to study the lifetime performance of these stacks, five actuators from one manufacturer were driven by a 60volt, 2 kHz sine-wave for ten billion cycles. The tests were performed using a Lab-View controlled automated data acquisition system that monitored the waveform of the stack electrical current and voltage. The measurements included the displacement, impedance, capacitance and leakage current and the analysis of the experimental results will be presented. en_US
dc.description.sponsorship NASA/JPL, Society of Photographic Instrumentation Engineers (SPIE) en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008 en_US
dc.subject piezoelectric devices en_US
dc.subject positioners en_US
dc.subject active mirrors en_US
dc.subject stacks en_US
dc.subject multilayers en_US
dc.title Multilayer piezoelectric stack actuator characterization en_US
dc.type Preprint en_US


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