dc.contributor.author |
Lutz, Robyn |
|
dc.date.accessioned |
2009-04-08T19:54:09Z |
|
dc.date.available |
2009-04-08T19:54:09Z |
|
dc.date.issued |
2007-05-15 |
|
dc.identifier.citation |
NASA Software Assurance Research Program,FY2007 software assurance research initiative proposal for the NASA Software IV & V Facility |
en_US |
dc.identifier.clearanceno |
07-2165 |
|
dc.identifier.uri |
http://hdl.handle.net/2014/41221 |
|
dc.description.abstract |
This report presents the results from the first task of the SARP Center Initiative, "Product Line Verification of Safety-Critical Software." Task 1 is a literature survey of available techniques for product line verification and validation. Section 1 of the report provides an introduction to product lines and motivates the survey of verification techniques. It describes what is reused in product-line engineering and
explains the goal of verifiable conformance of the developed system to its product-line specifications. Section 2 of the report describes six lifecycle steps in product-line verification and validation. This description is based on, and refers to, the best practices extracted from the readings. It ends with a list of verification challenges for NASA product lines (2. 7) and verification enablers for NASA product lines (2.8) derived from the survey. Section 3 provides resource lists of related conferences, workshops, industrial and defense industry experiences and case studies of product lines, and academic/industrial consortiums. Section 4 is a bibliography of papers and tutorials with annotated entries for relevant papers not previously discussed in sections 2 or 3. |
en_US |
dc.description.sponsorship |
NASA/JPL |
en_US |
dc.language.iso |
en_US |
en_US |
dc.publisher |
Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2007. |
en_US |
dc.subject |
product line |
en_US |
dc.subject |
verification |
en_US |
dc.subject |
testing |
en_US |
dc.title |
Survey of product-line verification and validation techniques |
en_US |
dc.type |
Technical Report |
en_US |