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Survey of product-line verification and validation techniques

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dc.contributor.author Lutz, Robyn
dc.date.accessioned 2009-04-08T19:54:09Z
dc.date.available 2009-04-08T19:54:09Z
dc.date.issued 2007-05-15
dc.identifier.citation NASA Software Assurance Research Program,FY2007 software assurance research initiative proposal for the NASA Software IV & V Facility en_US
dc.identifier.clearanceno 07-2165
dc.identifier.uri http://hdl.handle.net/2014/41221
dc.description.abstract This report presents the results from the first task of the SARP Center Initiative, "Product Line Verification of Safety-Critical Software." Task 1 is a literature survey of available techniques for product line verification and validation. Section 1 of the report provides an introduction to product lines and motivates the survey of verification techniques. It describes what is reused in product-line engineering and explains the goal of verifiable conformance of the developed system to its product-line specifications. Section 2 of the report describes six lifecycle steps in product-line verification and validation. This description is based on, and refers to, the best practices extracted from the readings. It ends with a list of verification challenges for NASA product lines (2. 7) and verification enablers for NASA product lines (2.8) derived from the survey. Section 3 provides resource lists of related conferences, workshops, industrial and defense industry experiences and case studies of product lines, and academic/industrial consortiums. Section 4 is a bibliography of papers and tutorials with annotated entries for relevant papers not previously discussed in sections 2 or 3. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2007. en_US
dc.subject product line en_US
dc.subject verification en_US
dc.subject testing en_US
dc.title Survey of product-line verification and validation techniques en_US
dc.type Technical Report en_US


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