Keywords:cyclotron; heavy ion; microprocessors; silicon-on-insulator
Publisher:IEEE
Citation:IEEE Transactions on Nuclear Science, Vol. 51, No. 6, p. 3505-3509, December 2004
Abstract:
Single-event upset (SEU) from heavy ions is measured for advanced commercial microprocessors in a dynamic mode with clock frequencies up to 1 GHz. Frequency and core voltage dependence of SEUs in registers and D-Cache are discussed. The results of our studies suggest the SEU in registers and D-Cache tend to increase with frequency. This might have important implications for the overall SEU trend as technology moves toward higher frequencies.