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Commercial sensor survey Fiscal Year 2008 compendium radiation test report

Show simple item record Becker, Heidi N. Dolphin, Michael D. Thorbourn, Dennis O. Alexander, James W. Salomon, Phil M. 2009-01-06T17:48:18Z 2009-01-06T17:48:18Z 2008-10
dc.description.abstract The NASA Electronic Parts and Packaging (NEPP) Program Sensor Technology Commercial Sensor Survey task is geared toward benefiting future NASA space missions with low-cost, short-duty-cycle, visible-wavelength imaging needs. Such applications could include imaging for educational outreach purposes or short surveys of spacecraft, planetary, or lunar surfaces. Under the task, inexpensive commercial grade CMOS sensors were surveyed in fiscal year 2007 (FY07) and three sensors were selected for total ionizing dose (TID) and displacement damage dose (DDD) tolerance testing. The selected sensors had to meet selection criteria chosen to support small, low-mass cameras that produce good resolution color images. These criteria were discussed in detail in [1], and are provided again in Appendix 1 of this document. This compendium provides results for all radiation testing performed in FY08 on the Micron and OmniVision sensors that were selected in FY07 for radiation tolerance testing. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2008. en_US
dc.relation.ispartofseries JPL Publication en_US
dc.relation.ispartofseries 08-26 en_US
dc.subject Micron en_US
dc.subject OmniVision (OV) en_US
dc.subject Charge Coupled Devices (CCD) en_US
dc.subject Complementary Metal Oxide Semiconductor (CMOS) en_US
dc.title Commercial sensor survey Fiscal Year 2008 compendium radiation test report en_US
dc.type Technical Report en_US

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