JPL Technical Report Server

Assessing and mitigating radiation effects in Xilinx FPGAs

Show simple item record Adell, Philippe Allen, Greg 2008-04-29T20:09:45Z 2008-04-29T20:09:45Z 2008-02
dc.description.abstract The main purpose of this guideline is to document the current understanding of the effort and tradeoffs involved in using SRAM-based FPGAs with maximum achievable upset tolerance. This guideline summarizes the different testing strategies to be considered when assessing the SEE tolerance of SRAM-based FPGAs. For critical applications, in-beam testing of flight designs is strongly recommended in order to verify that the upset mitigation is working as well as the designer intended. At present, there are four manufacturers (Actel, Xilinx, Atmel, and Aeroflex) offering six FPGA types to the military market (i.e., some military spec screening and testing are specified) and four device types to the aerospace application market, which indicates that the manufacturers have added radiation parameter specifications. There is also a Honeywell and BAE Systems device that has been under development for several years, but it does not appear to be available yet; inquiries to Honeywell’s military/aerospace marketing arm on this product have been unanswered. en_US
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US en_US
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, California Institute of Technology, 2008 en_US
dc.relation.ispartofseries JPL Publication en_US
dc.relation.ispartofseries 08-09 en_US
dc.subject Static Random Access Memory (SRAM) en_US
dc.subject radiation effects en_US
dc.subject Field-Programmable Gate Arrays (FPGAs) en_US
dc.title Assessing and mitigating radiation effects in Xilinx FPGAs en_US
dc.type Technical Report en_US

Files in this item

This item appears in the following Collection(s)

Show simple item record



My Account