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Test results of total ionizing dose conducted at the Jet Propulsion Laboratory

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dc.contributor.author Rivas, Rosa M.
dc.contributor.author Johnston, Allan H.
dc.contributor.author Miyahira, Tetsuo F.
dc.contributor.author Rax, Bernard G.
dc.contributor.author Wiedeman, Michael D.
dc.date.accessioned 2006-11-28T19:11:25Z
dc.date.available 2006-11-28T19:11:25Z
dc.date.issued 2004-06-20
dc.identifier.citation IEEE Nuclear and Space Radiation Effects Conference, Altlanta, Georgia, June 20, 2004. en
dc.identifier.clearanceno 04-2333
dc.identifier.uri http://hdl.handle.net/2014/39963
dc.description.abstract This paper reports recent Total Ionizing Dose (TID) test results obtained at JPL. Several device samples were analyzed exhibiting significant failure levels and ELDRS effects under biased and unbiased condition. en
dc.description.sponsorship NASA/JPL en
dc.format.extent 1975202 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004. en
dc.subject Bipolar en
dc.subject Complementary Metal Oxide Semiconductors (CMOS) en
dc.subject Enhanced Low Dose Rate Sensitivity (ELDRS) en
dc.subject High Dose Level (HDL) en
dc.subject Low Dose Level (LDL) en
dc.subject Total Ionizing Dose (TID) en
dc.title Test results of total ionizing dose conducted at the Jet Propulsion Laboratory en
dc.type Preprint en


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