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MSTAR: an absolute metrology system with submicrometer accuracy

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dc.contributor.author Lay, Oliver P.
dc.contributor.author Dubovitsky, Serge
dc.contributor.author Peters, Robert D.
dc.contributor.author Burger, Johan
dc.contributor.author Steier, William H.
dc.contributor.author Ahn, Seh-Won
dc.contributor.author Fetterman, Harrold R.
dc.date.accessioned 2006-01-26T23:09:31Z
dc.date.available 2006-01-26T23:09:31Z
dc.date.issued 2004-06-21
dc.identifier.citation SPIE Astronomical Telescopes and Instrumentation, Glasgow, UK, June 21-25, 2004. en
dc.identifier.clearanceno 04-1338
dc.identifier.uri http://hdl.handle.net/2014/38388
dc.description.abstract Laser metrology systems are a key component of stellar interferometers, used to monitor path lengths and dimensions internal to the instrument. Most interferometers use ‘relative’ metrology, in which the integer number of wavelengths along the path is unknown, and the measurement of length is ambiguous. Changes in the path length can be measured relative to an initial calibration point, but interruption of the metrology beam at any time requires a re-calibration of the system. The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. We describe the design of the system, show results for target distances up to 1 meter, and demonstrate how the system can be scaled to kilometer-scale distances. In recent experiments, we have used white light interferometry to augment the ‘truth’ measurements and validate the zero-point of the system. MSTAR is a general-purpose tool for conveniently measuring length with much greater accuracy than was previously possible, and has a wide range of possible applications en
dc.description.sponsorship NASA/JPL en
dc.format.extent 1399674 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA. : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004. en
dc.subject absolute metrology en
dc.subject distance measurement en
dc.title MSTAR: an absolute metrology system with submicrometer accuracy en
dc.type Preprint en


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