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Wide angle astrometric demonstration on the micro-arcsecond metrology testbed for the space interferometry mission.

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dc.contributor.author Goullioud, Renaud
dc.contributor.author Shen, Tsae-Pyng J.
dc.contributor.author Catanzarite, Joseph H.
dc.date.accessioned 2006-01-25T23:02:24Z
dc.date.available 2006-01-25T23:02:24Z
dc.date.issued 2004-03-30
dc.identifier.citation ICSO 2004 5th International Conference on Space Optics, Toulouse, France, March 30, 2004 en
dc.identifier.clearanceno 04-0787
dc.identifier.uri http://hdl.handle.net/2014/38378
dc.description.abstract The Space Interferometry Mission (SIM) requires fringe measurements to the level of picometers in order to produce astrometric data at the micro-arc-second level. To be more specific, it is necessary to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer to a few hundreds of picometers. The internal path is measured with a small heterodyne metrology beam, whereas the starlight fringe position is estimated with a CCD sampling a large concentric annular beam. One major challenge for SIM is to align the metrology beam with the starlight beam to keep the consistency between these two sensors at the system level while articulating the instrument optics over the field of view en
dc.description.sponsorship NASA/JPL en
dc.format.extent 1275913 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004 en
dc.subject interferometry en
dc.subject metrology en
dc.subject Space Interfermoetry Mission (SIM) en
dc.title Wide angle astrometric demonstration on the micro-arcsecond metrology testbed for the space interferometry mission. en
dc.type Preprint en


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