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TID, SEE and radiation induced failures in advanced flash memories

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dc.contributor.author Nguyen, D. N.
dc.contributor.author Scheick, L. Z.
dc.date.accessioned 2005-12-28T23:20:44Z
dc.date.available 2005-12-28T23:20:44Z
dc.date.issued 2003-11
dc.identifier.citation 2003 Non-volatile Memory Technology Symposium, San Diego, CA, November 12-13, 2003 en
dc.identifier.clearanceno 03-2932
dc.identifier.uri http://hdl.handle.net/2014/38306
dc.description.sponsorship NASA en
dc.format.extent 6888197 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003. en
dc.subject flash memories en
dc.subject TID en
dc.subject SEE en
dc.title TID, SEE and radiation induced failures in advanced flash memories en
dc.type Presentation en


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