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TID, SEE and radiation induced failures in advanced flash memories
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TID, SEE and radiation induced failures in advanced flash memories
Nguyen, D. N.
;
Scheick, L. Z.
URI:
http://hdl.handle.net/2014/38306
Date:
2003-11
Keywords:
flash memories; TID; SEE
Publisher:
Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003.
Citation:
2003 Non-volatile Memory Technology Symposium, San Diego, CA, November 12-13, 2003
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JPL TRS 1992+
JPL TRS 1992+
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