JPL Technical Report Server

TID, SEE and radiation induced failures in advanced flash memories

TID, SEE and radiation induced failures in advanced flash memories

Nguyen, D. N.; Scheick, L. Z.
URI: http://hdl.handle.net/2014/38306
Date: 2003-11
Keywords: flash memories; TID; SEE
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003.
Citation: 2003 Non-volatile Memory Technology Symposium, San Diego, CA, November 12-13, 2003

Show full item record

Items in TRS are protected by copyright, but are furnished with U.S. government purpose use rights.

Files in this item

Thumbnail
Name: 03-2932.pdf
Size: 6.569Mb
Format: PDF
View/Open

This item appears in the following Collection(s)

Search


Browse

My Account