Keywords:APS; hot pixel; single hard error; dark current
Publisher:Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003.
Citation:RADESCS, Noordwik, Netherlands, September 15-19, 2003
Abstract:
The dosimetric response of an active pixel sensor is analyzed. heavy ions are seen to damage the pixel in much the same way as gamma radiation. The probability of a hot pixel is seen to exhibit behavior that is not typical with other microdose effects.