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Hot pixel generation in active pixel sensors: dosimetric and micro-dosimetric response

Hot pixel generation in active pixel sensors: dosimetric and micro-dosimetric response

Scheick, Leif; Novak, Frank
URI: http://hdl.handle.net/2014/38215
Date: 2003-09
Keywords: APS; hot pixel; single hard error; dark current
Publisher: Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003.
Citation: RADESCS, Noordwik, Netherlands, September 15-19, 2003

Abstract:

The dosimetric response of an active pixel sensor is analyzed. heavy ions are seen to damage the pixel in much the same way as gamma radiation. The probability of a hot pixel is seen to exhibit behavior that is not typical with other microdose effects.

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