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Catastrophic SEE in high-voltage power MOSFETs

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Catastrophic SEE in high-voltage power MOSFETs

Selva, L. E.; Scheick, L. Z.; McClure, S.; Swift, G. M.; Miyahira, T.; Guertin, S. M.; Shah, S. K.; Edmonds, L. D.; Patterson, J. D.
URI: http://hdl.handle.net/2014/38199
Date: 2003-07
Keywords: MOSFET; high-voltage
Publisher: IEEE
Citation: IEEE Radiation Effects Data Workshop Monterey, CA, July 21-25, 2003 Page(s):113-120; doi:10.1109/REDW.2003.1281360

Abstract:

Heavy ion irradiation of high-voltage power MOSFETs with long-range ions was performed using 14, 19, 22, 24, 28 and 39 MeV-cm2/mg ions.

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