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Catastrophic SEE in high-voltage power MOSFETs
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Catastrophic SEE in high-voltage power MOSFETs
Selva, L. E.
;
Scheick, L. Z.
;
McClure, S.
;
Swift, G. M.
;
Miyahira, T.
;
Guertin, S. M.
;
Shah, S. K.
;
Edmonds, L. D.
;
Patterson, J. D.
URI:
http://hdl.handle.net/2014/38199
Date:
2003-07
Keywords:
MOSFET; high-voltage
Publisher:
IEEE
Citation:
IEEE Radiation Effects Data Workshop Monterey, CA, July 21-25, 2003 Page(s):113-120; doi:10.1109/REDW.2003.1281360
Abstract:
Heavy ion irradiation of high-voltage power MOSFETs with long-range ions was performed using 14, 19, 22, 24, 28 and 39 MeV-cm2/mg ions.
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JPL TRS 1992+
JPL TRS 1992+
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