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Reliability of COTS MEMS accelerometer under shock and thermomechanical cycling

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dc.contributor.author Teverovsky, A. en_US
dc.contributor.author Ghaffarian, R.
dc.contributor.author Sutton, D. G.
dc.contributor.author Chaffee, P.
dc.contributor.author Marquez, N.
dc.contributor.author Sharma, A. K.
dc.date.accessioned 2004-11-09T21:35:53Z
dc.date.available 2004-11-09T21:35:53Z
dc.date.issued 2001-09-01 en_US
dc.identifier.citation Surface Mount Technology Association en_US
dc.identifier.citation Chicago, IL, USA en_US
dc.identifier.clearanceno 01-1685 en_US
dc.identifier.uri http://hdl.handle.net/2014/36836
dc.description.abstract A comparison of the data from microaccelerometers of the same type and between several types will be presented. Self-test output signals and X-ray evaluation test data after completion of 182 thermal cycles will also be presented. en_US
dc.format.extent 1216545 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other MEMS thermal cycling microaccelerometers en_US
dc.title Reliability of COTS MEMS accelerometer under shock and thermomechanical cycling en_US


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