Reliability of COTS MEMS accelerometer under shock and thermomechanical cycling

Teverovsky, A.; Ghaffarian, R.; Sutton, D. G.; Chaffee, P.; Marquez, N.; Sharma, A. K.

dc.contributor.author	Teverovsky, A.	en_US
dc.contributor.author	Ghaffarian, R.
dc.contributor.author	Sutton, D. G.
dc.contributor.author	Chaffee, P.
dc.contributor.author	Marquez, N.
dc.contributor.author	Sharma, A. K.
dc.date.accessioned	2004-11-09T21:35:53Z
dc.date.available	2004-11-09T21:35:53Z
dc.date.issued	2001-09-01	en_US
dc.identifier.citation	Surface Mount Technology Association	en_US
dc.identifier.citation	Chicago, IL, USA	en_US
dc.identifier.clearanceno	01-1685	en_US
dc.identifier.uri	http://hdl.handle.net/2014/36836
dc.description.abstract	A comparison of the data from microaccelerometers of the same type and between several types will be presented. Self-test output signals and X-ray evaluation test data after completion of 182 thermal cycles will also be presented.	en_US
dc.format.extent	1216545 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	MEMS thermal cycling microaccelerometers	en_US
dc.title	Reliability of COTS MEMS accelerometer under shock and thermomechanical cycling	en_US