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TID testing of FeRAM memories

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dc.contributor.author Nguyen, D. en_US
dc.contributor.author Scheick, O. L. en_US
dc.date.accessioned 2004-11-09T21:31:18Z
dc.date.available 2004-11-09T21:31:18Z
dc.date.issued 2001-07-17 en_US
dc.identifier.citation IEEE Nuclear and Space Radiation Effects Conference en_US
dc.identifier.citation Vancouver, BC, Canada en_US
dc.identifier.clearanceno 01-1322 en_US
dc.identifier.uri http://hdl.handle.net/2014/36811
dc.description.abstract This paper presents TID testing of 64Kb ramton FM1608 and 256Kb ramtron FM 1808. en_US
dc.format.extent 177372 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other FeRAM FsRAM TID ferroelectric en_US
dc.title TID testing of FeRAM memories en_US


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