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TID testing of FeRAM memories

Show simple item record Nguyen, D. en_US Scheick, O. L. en_US 2004-11-09T21:31:18Z 2004-11-09T21:31:18Z 2001-07-17 en_US
dc.identifier.citation IEEE Nuclear and Space Radiation Effects Conference en_US
dc.identifier.citation Vancouver, BC, Canada en_US
dc.identifier.clearanceno 01-1322 en_US
dc.description.abstract This paper presents TID testing of 64Kb ramton FM1608 and 256Kb ramtron FM 1808. en_US
dc.format.extent 177372 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other FeRAM FsRAM TID ferroelectric en_US
dc.title TID testing of FeRAM memories en_US

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