TID testing of FeRAM memories

dc.contributor.author	Nguyen, D.	en_US
dc.contributor.author	Scheick, O. L.	en_US
dc.date.accessioned	2004-11-09T21:31:18Z
dc.date.available	2004-11-09T21:31:18Z
dc.date.issued	2001-07-17	en_US
dc.identifier.citation	IEEE Nuclear and Space Radiation Effects Conference	en_US
dc.identifier.citation	Vancouver, BC, Canada	en_US
dc.identifier.clearanceno	01-1322	en_US
dc.identifier.uri	http://hdl.handle.net/2014/36811
dc.description.abstract	This paper presents TID testing of 64Kb ramton FM1608 and 256Kb ramtron FM 1808.	en_US
dc.format.extent	177372 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	FeRAM FsRAM TID ferroelectric	en_US
dc.title	TID testing of FeRAM memories	en_US