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Accelerated Testing of GaAs FETs; Dealing with the Nightmare of Test Result Interpretation

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dc.contributor.author Nguyen, Tien Thanh en_US
dc.date.accessioned 2004-10-03T03:37:06Z
dc.date.available 2004-10-03T03:37:06Z
dc.date.issued 1995
dc.identifier.citation Anaheim, California en_US
dc.identifier.clearanceno 95-0723
dc.identifier.uri http://hdl.handle.net/2014/30858
dc.description.abstract The primary goal of accelerated tests is to determine in a relatively short or reasonable time period en_US
dc.format.extent 13958 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Testing GaAs FETs en_US
dc.title Accelerated Testing of GaAs FETs; Dealing with the Nightmare of Test Result Interpretation en_US


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