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Heavy Ion and Proton Induced Single Event Transients in Linear Devices

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dc.contributor.author Nichols, D. K. en_US
dc.contributor.author Coss, J. R. en_US
dc.contributor.author Miyahira, T. en_US
dc.contributor.author Schwartz, H. R. en_US
dc.date.accessioned 2004-09-30T22:27:32Z
dc.date.available 2004-09-30T22:27:32Z
dc.date.issued 1996-06-27 en_US
dc.identifier.citation Indian Wells, California, USA en_US
dc.identifier.clearanceno 96-1083 en_US
dc.identifier.uri http://hdl.handle.net/2014/26065
dc.description.abstract This paper presents a display of heavy-ion and proton-induced single event transients for selected linear devices. The transient vital signs are serious; low LET threshold, high voltage amplitude and extended pulse duration (microsecs.). en_US
dc.format.extent 1052028 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other heavy ions ions transients linear devices LET threshold pulse duration en_US
dc.title Heavy Ion and Proton Induced Single Event Transients in Linear Devices en_US


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