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Reliability Modeling of MCMs - RELTECH Lessons Learned

Show simple item record Newell, James M. en_US Larson, Timothy W. en_US Gersch, Glenn en_US Stoklosa, Mark en_US 2004-09-30T03:31:17Z 2004-09-30T03:31:17Z 1996-04-17 en_US
dc.identifier.citation Denver, Colorado, USA en_US
dc.identifier.clearanceno 96-0323 en_US
dc.description.abstract The rapid development of advanced electronic packaging and interconnect technologiew, specifically MCMs, requires effective ways of evaluating the reliability of these packages... en_US
dc.format.extent 521402 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other MCM packaging reliability modeling analysis thermo-mechanical en_US
dc.title Reliability Modeling of MCMs - RELTECH Lessons Learned en_US

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