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Proton Damage Effects in Linear Integrated Circuts

Proton Damage Effects in Linear Integrated Circuts

Rax, B.; Johnston, A.; Lee, C.
URI: http://hdl.handle.net/2014/20294
Date: 1998-07-20
Citation: MTG: IEEE Transactions on Nuclear Science
Newport Beach, CA, U.S.A.

Abstract:

Proton testing of linear circuits has identified devices where significantly more damage occurs at equivalent total dose levels with protons than tests with gamma rays.

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