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Continuing radiation evaluation of commercial-off-the-shelf devices for space applications

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dc.contributor.author Gorelick, J. en_US
dc.contributor.author McClure, S. en_US
dc.date.accessioned 2004-09-23T21:05:38Z
dc.date.available 2004-09-23T21:05:38Z
dc.date.issued 2000-07-24 en_US
dc.identifier.citation 2000 IEEE radiation effects-data workshop, pp. 6-10 en_US
dc.identifier.citation Los Angeles, CA USA en_US
dc.identifier.clearanceno 00-1523 en_US
dc.identifier.uri http://hdl.handle.net/2014/15784
dc.description.abstract Radiation test results are presented for a number of commercial transistors and integrated circuits procured in both ceramic and plastic packages. en_US
dc.format.extent 265123 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Radiation itergrated circuts ceramic transistors en_US
dc.title Continuing radiation evaluation of commercial-off-the-shelf devices for space applications en_US


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