Continuing radiation evaluation of commercial-off-the-shelf devices for space applications

Gorelick, J.; McClure,  S.

dc.contributor.author	Gorelick, J.	en_US
dc.contributor.author	McClure, S.	en_US
dc.date.accessioned	2004-09-23T21:05:38Z
dc.date.available	2004-09-23T21:05:38Z
dc.date.issued	2000-07-24	en_US
dc.identifier.citation	2000 IEEE radiation effects-data workshop, pp. 6-10	en_US
dc.identifier.citation	Los Angeles, CA USA	en_US
dc.identifier.clearanceno	00-1523	en_US
dc.identifier.uri	http://hdl.handle.net/2014/15784
dc.description.abstract	Radiation test results are presented for a number of commercial transistors and integrated circuits procured in both ceramic and plastic packages.	en_US
dc.format.extent	265123 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	Radiation itergrated circuts ceramic transistors	en_US
dc.title	Continuing radiation evaluation of commercial-off-the-shelf devices for space applications	en_US