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Narrow band emission from lithographically defined photonic bandgap structures in silicon: matching theory and experiment

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dc.contributor.author Greenwald, A. C. en_US
dc.contributor.author Daly, J. T. en_US
dc.contributor.author Johnson, E. A. en_US
dc.contributor.author Kinkade, B. en_US
dc.contributor.author McNeal, M. en_US
dc.contributor.author Pralle, M. en_US
dc.contributor.author Moelders, N. en_US
dc.contributor.author George, T. en_US
dc.contributor.author Choi, D. S. en_US
dc.contributor.author Biswas, R. en_US
dc.contributor.author El-Kady, I. en_US
dc.date.accessioned 2004-09-22T22:20:28Z
dc.date.available 2004-09-22T22:20:28Z
dc.date.issued 2001-11-27 en_US
dc.identifier.citation MRS Fall Meeting en_US
dc.identifier.clearanceno 01-0023 en_US
dc.identifier.uri http://hdl.handle.net/2014/12143
dc.description.abstract The authors previously reported discovery of narrow, thermal emission bands from symmetrically patterned features etched into silicon wafers. In this paper, we report further results that show the measured absorption peaks for such patterned surfaces match theoretical calculations of the complete electrodynamic problem solved using the Transfer Matrix Method (TMM). en_US
dc.format.extent 824350 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other photonic bandgap MEMS en_US
dc.title Narrow band emission from lithographically defined photonic bandgap structures in silicon: matching theory and experiment en_US


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