dc.contributor.author | Greenwald, A. C. | en_US |
dc.contributor.author | Daly, J. T. | en_US |
dc.contributor.author | Johnson, E. A. | en_US |
dc.contributor.author | Kinkade, B. | en_US |
dc.contributor.author | McNeal, M. | en_US |
dc.contributor.author | Pralle, M. | en_US |
dc.contributor.author | Moelders, N. | en_US |
dc.contributor.author | George, T. | en_US |
dc.contributor.author | Choi, D. S. | en_US |
dc.contributor.author | Biswas, R. | en_US |
dc.contributor.author | El-Kady, I. | en_US |
dc.date.accessioned | 2004-09-22T22:20:28Z | |
dc.date.available | 2004-09-22T22:20:28Z | |
dc.date.issued | 2001-11-27 | en_US |
dc.identifier.citation | MRS Fall Meeting | en_US |
dc.identifier.clearanceno | 01-0023 | en_US |
dc.identifier.uri | http://hdl.handle.net/2014/12143 | |
dc.description.abstract | The authors previously reported discovery of narrow, thermal emission bands from symmetrically patterned features etched into silicon wafers. In this paper, we report further results that show the measured absorption peaks for such patterned surfaces match theoretical calculations of the complete electrodynamic problem solved using the Transfer Matrix Method (TMM). | en_US |
dc.format.extent | 824350 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.subject.other | photonic bandgap MEMS | en_US |
dc.title | Narrow band emission from lithographically defined photonic bandgap structures in silicon: matching theory and experiment | en_US |