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Overview of SIM external calibration

Show simple item record Shaklan, S. en_US Milman, M. en_US Catanzarite, J. en_US Papalexandris, M. en_US Basdogan, I. en_US Sievers, L. en_US Swartz, R. en_US 2004-09-17T18:15:17Z 2004-09-17T18:15:17Z 2002-08-22 en_US
dc.identifier.citation Astronomical Telescopes and Instrumentation en_US
dc.identifier.citation Waikaloa, HI, USA en_US
dc.identifier.clearanceno 02-2066 en_US
dc.description.abstract Like all astrometric instruments, the Space Interferometry Mission (SIM) suffers from field-dependent errors requiring calibration. Diffraction effects in the delay line, polarization rotations on comer cubes, and beam walk across imperfect optics, all contribute to field-distortion that is significantly larger than is acceptable. The bulk of the systematic error is linear across the field - that is, it results in a magnification error. We show that the linear terms are inconsequential to the performance of SIM because they are inseparable from baseline length and orientation errors. One approach to calibrating the higher-order terms is to perform external' calibration; that is, SIM periodically makes differential measurements of a field of bright stars whose positions are not precisely known. We describe the requirements and constraints on the external calibration process and lay the groundwork for a specific procedure detailed in accompanying papers. en_US
dc.format.extent 3753463 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Space Interferometry Mission SIM interferometry calibration en_US
dc.title Overview of SIM external calibration en_US

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