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MAM testbed data analysis: cyclic averaging

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dc.contributor.author Pan, X. en_US
dc.contributor.author Zhao, F. en_US
dc.contributor.author Shao, M. en_US
dc.date.accessioned 2004-09-17T07:26:55Z
dc.date.available 2004-09-17T07:26:55Z
dc.date.issued 2002-08-22 en_US
dc.identifier.citation Astronomical Telescopes and Instrumentation en_US
dc.identifier.citation Waikoloa, HI, USA en_US
dc.identifier.clearanceno 02-1949 en_US
dc.identifier.uri http://hdl.handle.net/2014/9795
dc.description.abstract The micro-arcsecond metrology testbed (MAM) provides a testing ground for SIM to perform optical path difference measurements with picometer (pm) precision. en_US
dc.format.extent 2725057 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other space interferometry instrumentation cyclic bias en_US
dc.title MAM testbed data analysis: cyclic averaging en_US


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