MAM testbed data analysis: cyclic averaging

Pan, X.; Zhao,  F.; Shao,  M.

dc.contributor.author	Pan, X.	en_US
dc.contributor.author	Zhao, F.	en_US
dc.contributor.author	Shao, M.	en_US
dc.date.accessioned	2004-09-17T07:26:55Z
dc.date.available	2004-09-17T07:26:55Z
dc.date.issued	2002-08-22	en_US
dc.identifier.citation	Astronomical Telescopes and Instrumentation	en_US
dc.identifier.citation	Waikoloa, HI, USA	en_US
dc.identifier.clearanceno	02-1949	en_US
dc.identifier.uri	http://hdl.handle.net/2014/9795
dc.description.abstract	The micro-arcsecond metrology testbed (MAM) provides a testing ground for SIM to perform optical path difference measurements with picometer (pm) precision.	en_US
dc.format.extent	2725057 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	space interferometry instrumentation cyclic bias	en_US
dc.title	MAM testbed data analysis: cyclic averaging	en_US