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MAM testbed data analysis: cyclic averaging

Show simple item record Pan, X. en_US Zhao, F. en_US Shao, M. en_US 2004-09-17T07:26:55Z 2004-09-17T07:26:55Z 2002-08-22 en_US
dc.identifier.citation Astronomical Telescopes and Instrumentation en_US
dc.identifier.citation Waikoloa, HI, USA en_US
dc.identifier.clearanceno 02-1949 en_US
dc.description.abstract The micro-arcsecond metrology testbed (MAM) provides a testing ground for SIM to perform optical path difference measurements with picometer (pm) precision. en_US
dc.format.extent 2725057 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other space interferometry instrumentation cyclic bias en_US
dc.title MAM testbed data analysis: cyclic averaging en_US

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