JPL Technical Report Server

Sensitivity of optical metrology calibration to measured corner cube retroreflector parameters for Space Interferometry Mission

Show simple item record

dc.contributor.author Kuan, G. M. en_US
dc.contributor.author Moser, S. J. en_US
dc.date.accessioned 2004-09-17T07:05:37Z
dc.date.available 2004-09-17T07:05:37Z
dc.date.issued 2002-08-22 en_US
dc.identifier.citation SPIE Astronomical Telescopes and Instrumentation Conference en_US
dc.identifier.citation Waikoloa, HI, USA en_US
dc.identifier.clearanceno 02-1743 en_US
dc.identifier.uri http://hdl.handle.net/2014/9633
dc.format.extent 1033352 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other interferometry metrology corner cube retroreflector dihedral en_US
dc.title Sensitivity of optical metrology calibration to measured corner cube retroreflector parameters for Space Interferometry Mission en_US


Files in this item

This item appears in the following Collection(s)

Show simple item record

Search


Browse

My Account