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SEE and TID of emerging non-volatile memories

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dc.contributor.author Nguyen, D. N. en_US
dc.contributor.author Scheick, L. S. en_US
dc.date.accessioned 2004-09-17T06:46:45Z
dc.date.available 2004-09-17T06:46:45Z
dc.date.issued 2002-07-15 en_US
dc.identifier.citation Nuclear and Space Radiation Effects Conference en_US
dc.identifier.citation Phoenix, AZ, USA en_US
dc.identifier.clearanceno 02-1641 en_US
dc.identifier.uri http://hdl.handle.net/2014/9423
dc.description.abstract We report on the SEE and TID tests of higher density flash memories. Stand-by currents and full functional tests were used to characterize the response of radiation effects. en_US
dc.format.extent 2629477 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other single-event upset non-volatile memories en_US
dc.title SEE and TID of emerging non-volatile memories en_US


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