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Single-event upset in advanced PowerPC microprocessors

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dc.contributor.author Irom, F. en_US
dc.contributor.author Swift, G. M. en_US
dc.contributor.author Farmanesh, F. en_US
dc.contributor.author Millward, D. G. en_US
dc.date.accessioned 2004-09-17T06:45:35Z
dc.date.available 2004-09-17T06:45:35Z
dc.date.issued 2002-07-15 en_US
dc.identifier.citation NSREC 2002; IEEE en_US
dc.identifier.citation Phoenix, AZ, USA en_US
dc.identifier.clearanceno 02-1610 en_US
dc.identifier.uri http://hdl.handle.net/2014/9398
dc.description.abstract Proton and heavy-ion single-event upset susceptibility has been measured for the MotorolaPowerPC7400. The results show that this advanced device has low upset susceptibility, despite the scaling and design advances. en_US
dc.format.extent 3102617 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other radiation single-event upset en_US
dc.title Single-event upset in advanced PowerPC microprocessors en_US


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