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Total dose dependency and ELDRS effects on bipolar linear devices

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dc.contributor.author Yui, C. C. en_US
dc.contributor.author McClure, S. S. en_US
dc.contributor.author Rax, B. G. en_US
dc.contributor.author Lehman, J. M. en_US
dc.contributor.author Minto, T. D. en_US
dc.contributor.author Wiedeman, M. en_US
dc.date.accessioned 2004-09-17T06:45:12Z
dc.date.available 2004-09-17T06:45:12Z
dc.date.issued 2002-07-15 en_US
dc.identifier.citation NSREC - 2002 en_US
dc.identifier.citation Phoenix, AZ, USA en_US
dc.identifier.clearanceno 02-1588 en_US
dc.identifier.uri http://hdl.handle.net/2014/9389
dc.description.abstract The use of bipolar linear devices is prevalent in most satellite and some space applications. However, degradation as a result of low dose irradiations known as ELDERS (effects of enhanced low dose rate sensitivity) is a major concern when selecting flight hardware. Many studies and reports have been conducted on this possible phenomenon as well as their responsible physical mechanisms. en_US
dc.format.extent 2378237 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other ELDRS voltage regulator voltage reference en_US
dc.title Total dose dependency and ELDRS effects on bipolar linear devices en_US


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