dc.contributor.author | Mih, D. T. | en_US |
dc.date.accessioned | 2004-09-17T05:22:56Z | |
dc.date.available | 2004-09-17T05:22:56Z | |
dc.date.issued | 2002-05-30 | en_US |
dc.identifier.citation | NASA 2002 Assurance Technology Conference | en_US |
dc.identifier.citation | NASA GRC | en_US |
dc.identifier.clearanceno | 02-1260 | en_US |
dc.identifier.uri | http://hdl.handle.net/2014/8695 | |
dc.format.extent | 2497815 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.subject.other | x-ray real time nondestructive evaluation | en_US |
dc.title | NDE of microelectronics by real time x-ray imaging | en_US |