NDE of microelectronics by real time x-ray imaging

dc.contributor.author	Mih, D. T.	en_US
dc.date.accessioned	2004-09-17T05:22:56Z
dc.date.available	2004-09-17T05:22:56Z
dc.date.issued	2002-05-30	en_US
dc.identifier.citation	NASA 2002 Assurance Technology Conference	en_US
dc.identifier.citation	NASA GRC	en_US
dc.identifier.clearanceno	02-1260	en_US
dc.identifier.uri	http://hdl.handle.net/2014/8695
dc.format.extent	2497815 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	x-ray real time nondestructive evaluation	en_US
dc.title	NDE of microelectronics by real time x-ray imaging	en_US