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NDE of microelectronics by real time x-ray imaging

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dc.contributor.author Mih, D. T. en_US
dc.date.accessioned 2004-09-17T05:22:56Z
dc.date.available 2004-09-17T05:22:56Z
dc.date.issued 2002-05-30 en_US
dc.identifier.citation NASA 2002 Assurance Technology Conference en_US
dc.identifier.citation NASA GRC en_US
dc.identifier.clearanceno 02-1260 en_US
dc.identifier.uri http://hdl.handle.net/2014/8695
dc.format.extent 2497815 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other x-ray real time nondestructive evaluation en_US
dc.title NDE of microelectronics by real time x-ray imaging en_US


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