dc.contributor.author |
Lin, Y. |
en_US |
dc.contributor.author |
Chung, S. |
en_US |
dc.contributor.author |
Kazarians, G. A. |
en_US |
dc.contributor.author |
Blosiu, J. O. |
en_US |
dc.contributor.author |
Beaudet, R. A. |
en_US |
dc.contributor.author |
Quigley, M. S. |
en_US |
dc.contributor.author |
Kern, R. G. |
en_US |
dc.date.accessioned |
2004-09-17T05:22:38Z |
|
dc.date.available |
2004-09-17T05:22:38Z |
|
dc.date.issued |
2003-05-09 |
en_US |
dc.identifier.citation |
American Society for Microbiology 102nd General Meeting |
en_US |
dc.identifier.citation |
Salt Lake City, UT, USA |
en_US |
dc.identifier.clearanceno |
02-1238 |
|
dc.identifier.uri |
http://hdl.handle.net/2014/8687 |
|
dc.description.abstract |
In this study, we have extensively tested various cleaning protocols. The variant parameters included the type and concentration of solvent, type of wipe, pretreatment conditions, and various rinsing systems. Taguchi statistical method was used to design and evaluate various cleaning conditions on ten common spacecraft materials. |
en_US |
dc.format.extent |
6054008 bytes |
|
dc.format.mimetype |
application/pdf |
|
dc.language.iso |
en_US |
|
dc.subject.other |
Taguchi cleaning spacecraft materials |
en_US |
dc.title |
Taguchi statistical design and analysis of cleaning methods for spacecraft materials |
en_US |