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Angle-resolved ion charge state distribution measurements in a vacuum arc plasma using time-of-flight mass spectroscopy

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dc.contributor.author Polk, J. en_US
dc.date.accessioned 2004-09-17T05:14:55Z
dc.date.available 2004-09-17T05:14:55Z
dc.date.issued 2002-05 en_US
dc.identifier.citation International Conference on Plasma Science en_US
dc.identifier.citation Banff, Canada en_US
dc.identifier.clearanceno 02-1114 en_US
dc.identifier.uri http://hdl.handle.net/2014/8578
dc.format.extent 3123548 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other ion vacuum mass spectroscopy en_US
dc.title Angle-resolved ion charge state distribution measurements in a vacuum arc plasma using time-of-flight mass spectroscopy en_US


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