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Proton nonionizing energy loss (NIEL) for device applications
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Proton nonionizing energy loss (NIEL) for device applications
Jun, I.
;
Xapsos, M. A.
;
Messenger, S. R.
;
Burke, E. A.
;
Walters, R. J.
;
Summers, G. P.
;
Jordan, T.
URI:
http://hdl.handle.net/2014/7678
Date:
2003-07-21
Citation:
IEEE Nuclear and Space Radiation Effects Conference
Monterey, California, USA
Abstract:
The proton induced NIEL for representative device materials are presented for the energy range between 1 keV to 1000 MeV.
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JPL TRS 1992+
JPL TRS 1992+
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