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Proton nonionizing energy loss (NIEL) for device applications

Proton nonionizing energy loss (NIEL) for device applications

Jun, I.; Xapsos, M. A.; Messenger, S. R.; Burke, E. A.; Walters, R. J.; Summers, G. P.; Jordan, T.
URI: http://hdl.handle.net/2014/7678
Date: 2003-07-21
Citation: IEEE Nuclear and Space Radiation Effects Conference
Monterey, California, USA

Abstract:

The proton induced NIEL for representative device materials are presented for the energy range between 1 keV to 1000 MeV.

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