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Modeling defect trends for iterative development

Modeling defect trends for iterative development

Powell, J. D.; Spanguolo, J. N.
URI: http://hdl.handle.net/2014/7163
Date: 2003-06-17
Citation: 4th Joint International ISPA/SCEA International Conference and Education Workshop
Orlando, FL, USA

Abstract:

The Employment of Defects (EoD) approach to measuring and analyzing defects seeks to identify and capture trends and phenomena that are critical to managing software quality in the iterative software development lifecycle at JPL.

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