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Continuing evaluation of bipolar linear devices for total dose bias dependency and ELDRS effects

Continuing evaluation of bipolar linear devices for total dose bias dependency and ELDRS effects

McClure, S. S.; Gorelick, J. J.; Yui, C. C.; Rax, B. G.; Wiedeman, M. D.
URI: http://hdl.handle.net/2014/7100
Date: 2003-07-21
Citation: IEEE Nuclear and Space Radiation Effects Conference
Monterey, CA, USA

Abstract:

We present results of continuing efforts to evaluate total dose bias dependency and ELDRS effects in bipolar linear microcircuits. Several devices were evaluated, each exhibiting moderate to significant bias and/or dose rate dependency.

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