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Investigation of Application-Specific Bias Conditions and Dose Rate Dependency in Total Ionizing Dose (TID) Response

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dc.contributor.author Bozovich, Amanda N.
dc.contributor.author Nguyen, Duc
dc.contributor.author Rax, Bernard G.
dc.contributor.author Davila, Joe
dc.contributor.author Zajac, Stephanie A.
dc.date.accessioned 2022-01-12T22:44:32Z
dc.date.available 2022-01-12T22:44:32Z
dc.date.issued 2020-11-30
dc.identifier.citation IEEE Nuclear & Space Radiation Effects Conference, Santa Fe, New Mexico, November 30 - December 4, 2020
dc.identifier.clearanceno CL#20-6209
dc.identifier.uri http://hdl.handle.net/2014/53315
dc.description.abstract This paper investigates flight circuit application bias and irradiation dose rate dependencies (“test as you fly” conditions) in the total ionizing dose (TID) response of various electronic components considered for use in a space radiation environment.
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2020
dc.title Investigation of Application-Specific Bias Conditions and Dose Rate Dependency in Total Ionizing Dose (TID) Response
dc.type Preprint


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