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In-Situ Testing Methods for Mixed-Mode Harsh Environments

Show simple item record Scheick, Leif Z Thorbourn, D. O. Woo, A. R. Kim, W. Dawson, S. F. Low, N. M. Boca, A. Chinn, J. Z. Scrivner, R.L. Martin, E. Foster, J. T. Davies, R. D. 2021-11-01T18:34:47Z 2021-11-01T18:34:47Z 2020-07-20
dc.identifier.citation NSREC, Sante Fe, New Mexico, July 20-24, 2020
dc.identifier.clearanceno CL#20-0807
dc.description.abstract Future NASA missions are driving a need for instrumentation and space electronics that will operate at extreme temperatures, with low mass and extended deployments. This need results in devices that will experience dose damage at both low and high temperatures that will suppress annealing and induce accelerated wear out issues. Therefore, the ability to perform radiation tests on devices at temperature is critical. This paper analyses the methods and process to enable these test as developed at the JPL Dynamitron Facility. Since electronics are the radiation source for this facility, the steps to ensure parity with cobalt-60 testing are discussed. Also discussed are the implications for system level testing and mixed radiation mode testing for highly integrated and scaled devices.
dc.description.sponsorship NASA/JPL en_US
dc.language.iso en_US
dc.publisher Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2020
dc.title In-Situ Testing Methods for Mixed-Mode Harsh Environments
dc.type Preprint

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